学術論文誌(査読付)

[1] Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and Hitoshi Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, volume 2014, number Article ID 909762, 21pages, May 2014.

[2] Takeshi Sumi, Osamu Mizuno, Tohru Kikuno, and Masayuki Hirayama, "An Effective Testing Method for Hardware Related Fault in Embedded Software," IEICE Trans. on Information and Systems, volume E88-D, number 6, pages 1142-1149, June 2005.

[3] Sousuke Amasaki, Yasunari Takagi, Osamu Mizuno, and Tohru Kikuno, "Constructing a Bayesian Belief Network to Predict Final Quality in Embedded System Development," IEICE Trans. on Information and Systems, volume E88-D, number 6, pages 1134-1141, June 2005.

国際会議(査読付)

[1] Yasuyuki Arikawa, Kinari Nishiura, and Osamu Mizuno, "Finding Bugs in Embedded External Device Drivers Using Emulation," In Proc. of the 6th World Symposium of Software Engineering (WSSE 2024), 4 pages, September 2024.

[2] Takahiro Ando, Shinji Kawasaki, Eun-Hye Choi, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshioka, Keisuke Shimatani, Munekazu Furuichi, and Osamu Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --," In Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, number 4-4, November 2011.

[3] Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu, Osamu Mizuno, and Tohru Kikuno, "Elimination of Crucial Faults for Embedded Software Using Functional Priority Testing," In Proc. of 6th International Conference on Probabilistic Safety Assessment and Management (PSAM6), pages 715-721, June 2002.

テクニカルレポート

[1] Eun-Hye Choi, Takahiro Ando, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshisaka, Takao Sonoda, Shouichi Hasuike, and Osamu Mizuno, "Sens - Specification Language for Embedded Network Systems - Toward Automatic Test Generation (Preliminary Version)," number PS-2011-002, Collaborative Research Team for Verification and Specification, National Institute of Advanced Industrial Science and Technology, August 2011.

研究会・全国大会等

[1] 水野 修, 二木 俊樹, 新原 直樹, 高木 徳生, 菊野 亨, "ある企業におけるソフトウェアプロセス改善の効果に対する統計的分析," 電子情報通信学会技術研究報告, volume 98, number 294-295, SS98-26, pages 1-8, 1998年9月.