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M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "Elimination of Crucial Faults for Embedded Software Using Functional Priority Testing," In Proc. of 6th International Conference on Probabilistic Safety Assessment and Management (PSAM6), pp. 715-721, June 2002. | |
ID | 135 |
分類 | 国際会議(査読付) |
タグ | full-paper crucial elimination embedded faults functional priority software testing |
表題 (title) |
Elimination of Crucial Faults for Embedded Software Using Functional Priority Testing |
表題 (英文) |
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著者名 (author) |
Masayuki Hirayama,Tetsuya Yamamoto,Jiro Okayasu,Osamu Mizuno,Tohru Kikuno |
英文著者名 (author) |
Masayuki Hirayama,Tetsuya Yamamoto,Jiro Okayasu,Osamu Mizuno,Tohru Kikuno |
編者名 (editor) |
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編者名 (英文) |
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キー (key) |
Masayuki Hirayama,Tetsuya Yamamoto,Jiro Okayasu,Osamu Mizuno,Tohru Kikuno |
書籍・会議録表題 (booktitle) |
Proc. of 6th International Conference on Probabilistic Safety Assessment and Management (PSAM6) |
書籍・会議録表題(英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
715-721 |
組織名 (organization) |
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出版元 (publisher) |
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出版元 (英文) |
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出版社住所 (address) |
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刊行月 (month) |
6 |
出版年 (year) |
2002 |
採択率 (acceptance) |
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URL |
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付加情報 (note) |
Puerto Lico, USA. |
注釈 (annote) |
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内容梗概 (abstract) |
This paper discusses a new method for eliminating crucial faults in embedded software. Recent embedded software systems contain various functions or provide various services. Reflecting functional explosion of embedded software, the size and complexity of software increases so much. It is difficult to ensure their quality and to eliminate crucial faults by conventional software testing method because, in such large and complex software, too many test cases are required in order to cover all functions in a specification.
In this paper, we newly introduce an idea of functional priority testing and develop a new selective testing method. In this method, with prioritizing the functions in the target software, test items are selected according to their functional priorities. Important functions with high priorities are tested in detail, and functions with low priorities are tested less intensively. With using functional priorities, effective testing will be performed. The effectiveness of selective testing will be evaluated during experiments in actual software testing. |
論文電子ファイル | draft (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@inproceedings{id135, title = {Elimination of crucial faults for embedded software using functional priority testing}, author = {Masayuki Hirayama and Tetsuya Yamamoto and Jiro Okayasu and Osamu Mizuno and Tohru Kikuno}, booktitle = {Proc. of 6th International Conference on Probabilistic Safety Assessment and Management (PSAM6)}, pages = {715-721}, month = {6}, year = {2002}, note = {Puerto Lico, USA.}, } |