- 学術論文誌(査読付)
- [1] 西浦 生成, 水野 修, 崔 恩瀞, "Javaテストコードの再利用による自動生成に向けた移植可能なテストメソッドの調査," 情報処理学会論文誌, volume 62, number 4, pages 1019-1028, 2021年4月.
- [2] Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and Hitoshi Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, volume 2014, number Article ID 909762, 21pages, May 2014.
- [3] Masayuki Hirayama, Osamu Mizuno, and Tohru Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," Journal of Computer Science and Technology, volume 20, number 2, pages 250-257, March 2005.
- [4] Masayuki Hirayama, Osamu Mizuno, and Tohru Kikuno, "Test Item Prioritizing Metrics for Selective Software Testing," IEICE Trans. on Information and Systems, volume E87-D, number 12, pages 2733-2743, December 2004.
- 国際会議(査読付)
- [1] Mingyue Jiang, Tsong Yueh Chen, Fei-Ching Kuo, Zuohua Ding, Eun-Hye Choi, and Osamu Mizuno, "A Revisit of the Integration of Metamorphic Testing and Test Suite Based Automated Program Repair," In Proc. of 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET2017) (In conjunction with ICSE2017), pages 14-20, May 2017.
- [2] Eun-Hye Choi, Shunya Kawabata, Osamu Mizuno, Cyrille Artho, and Takashi Kitamura, "Test Effectiveness Evaluation of Prioritized Combinatorial Testing: a Case Study," In Proc. of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS2016), pages 61-68, August 2016.
- [3] Takahiro Ando, Shinji Kawasaki, Eun-Hye Choi, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshioka, Keisuke Shimatani, Munekazu Furuichi, and Osamu Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --," In Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, number 4-4, November 2011.
- [4] Masayuki Hirayama, Tetsuya Yamamoto, Osamu Mizuno, and Tohru Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," In Proc. of 12th Asian Test Symposium (ATS03), pages 210-215, November 2003.
- [5] Masayuki Hirayama, Jiro Okayasu, Tetsuya Yamamoto, Osamu Mizuno, and Tohru Kikuno, "Generating Test Items for Checking Illegal Behaviors in Software Testing," In Proc. of 9th Asian Test Symposium (ATS2000), pages 235-240, December 2000.
- [6] Masayuki Hirayama, Tetsuya Yamamoto, Takuya Kishimoto, Osamu Mizuno, and Tohru Kikuno, "Systematic Generation of Software Test Items Based on System Behavior from User's Viewpoint," In Proc. of International Conference on Probabilistic Safety Assessment and Management (PSAM5), pages 2377-2382, November 2000.
- テクニカルレポート
- [1] Eun-Hye Choi, Takahiro Ando, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshisaka, Takao Sonoda, Shouichi Hasuike, and Osamu Mizuno, "Sens - Specification Language for Embedded Network Systems - Toward Automatic Test Generation (Preliminary Version)," number PS-2011-002, Collaborative Research Team for Verification and Specification, National Institute of Advanced Industrial Science and Technology, August 2011.
- 研究会・全国大会等
- [1] 平山 雅之, 岸本 卓也, 水野 修, 菊野 亨, "UseCaseを利用したソフトウェアフォールトに対するSS-FTAの提案," 電子情報通信学会技術研究報告, volume 99, number 547-548, SS99-53, pages 25-32, 2000年1月.