Detail view
E. Choi, H. Nishihara, T. Ando, N. V. Tang, M. Aoki, K. Yoshisaka, O. Mizuno, and H. Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, 2014(Article ID 909762), 21pages, May 2014.
ID 676
分類 学術論文誌(査読付)
タグ automatic embedded formal generation network specification systems test
表題 (title) Formal Specification Based Automatic Test Generation for Embedded Network Systems
表題 (英文)
著者名 (author) Eun-Hye Choi,Hideaki Nishihara,Takahiro Ando,Nguyen Van Tang,Masahiro Aoki,Keiichi Yoshisaka,Osamu Mizuno,Hitoshi Osaki
英文著者名 (author) Eun-Hye Choi,Hideaki Nishihara,Takahiro Ando,Nguyen Van Tang,Masahiro Aoki,Keiichi Yoshisaka,Osamu Mizuno,Hitoshi Osaki
キー (key) Eun-Hye Choi,Hideaki Nishihara,Takahiro Ando,Nguyen Van Tang,Masahiro Aoki,Keiichi Yoshisaka,Osamu Mizuno,Hitoshi Osaki
定期刊行物名 (journal) Journal of Applied Mathematics
定期刊行物名 (英文)
巻数 (volume) 2014
号数 (number) Article ID 909762
ページ範囲 (pages) 21pages
刊行月 (month) 5
出版年 (year) 2014
Impact Factor (JCR) 0.834
URL http://dx.doi.org/10.1155/2014/909762
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 利用できません．
BiBTeXエントリ 
@article{id676,
         title = {Formal Specification based Automatic Test Generation for Embedded Network Systems},
        author = {Eun-Hye Choi and Hideaki Nishihara and Takahiro Ando and Nguyen Van Tang and Masahiro Aoki and Keiichi Yoshisaka and Osamu Mizuno and Hitoshi Osaki},
       journal = {Journal of Applied Mathematics},
        volume = {2014},
        number = {Article ID 909762},
         pages = {21pages},
         month = {5},
          year = {2014},
    impactfactor = {0.834 },
}