学術論文誌(査読付)

[1] 西浦 生成, 水野 修, 崔 恩瀞, "Javaテストコードの再利用による自動生成に向けた移植可能なテストメソッドの調査," 情報処理学会論文誌, volume 62, number 4, pages 1019-1028, 2021年4月.

[2] Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and Hitoshi Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, volume 2014, number Article ID 909762, 21pages, May 2014.

国際会議(査読付)

[1] Takahiro Ando, Shinji Kawasaki, Eun-Hye Choi, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshioka, Keisuke Shimatani, Munekazu Furuichi, and Osamu Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --," In Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, number 4-4, November 2011.

テクニカルレポート

[1] Eun-Hye Choi, Takahiro Ando, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshisaka, Takao Sonoda, Shouichi Hasuike, and Osamu Mizuno, "Sens - Specification Language for Embedded Network Systems - Toward Automatic Test Generation (Preliminary Version)," number PS-2011-002, Collaborative Research Team for Verification and Specification, National Institute of Advanced Industrial Science and Technology, August 2011.

学位論文

[1] 上北 裕也, "Cプログラム学習を支援するための穴あきヒントの自動生成," 修士学位論文, 京都工芸繊維大学, 2022年.