学術論文誌(査読付)

[1] Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and Hitoshi Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, volume 2014, number Article ID 909762, 21pages, May 2014.

[2] Sousuke Amasaki, Yasunari Takagi, Osamu Mizuno, and Tohru Kikuno, "Constructing a Bayesian Belief Network to Predict Final Quality in Embedded System Development," IEICE Trans. on Information and Systems, volume E88-D, number 6, pages 1134-1141, June 2005.

国際会議(査読付)

[1] Yuji Fujiwara, Norihiro Yoshida, and Eunjong Choi, "Code-To-Code Search Based on Deep Neural Network and Code Mutation," In the 13th International Workshop on Software Clones (IWSC 2019), pages 1-7, February 2019.

[2] Sousuke Amasaki, Yasunari Takagi, Osamu Mizuno, and Tohru Kikuno, "A Bayesian Belief Network for Assessing the Likelihood of Fault Content," In Proc. of 14th International Symposium on Software Reliability Engineering (ISSRE2003), pages 215-226, November 2003.

テクニカルレポート

[1] Eun-Hye Choi, Takahiro Ando, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshisaka, Takao Sonoda, Shouichi Hasuike, and Osamu Mizuno, "Sens - Specification Language for Embedded Network Systems - Toward Automatic Test Generation (Preliminary Version)," number PS-2011-002, Collaborative Research Team for Verification and Specification, National Institute of Advanced Industrial Science and Technology, August 2011.