SEL@KIT: T. Ando, S. Kawasaki, E. Choi, H. Nishihara, M. Aoki, K. Yoshioka, K. Shimatani, M. Furuichi, and O. Mizuno, Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --, November 2011.
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T. Ando, S. Kawasaki, E. Choi, H. Nishihara, M. Aoki, K. Yoshioka, K. Shimatani, M. Furuichi, and O. Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --," In Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, 4-4, November 2011.
ID 653
分類 国際会議(査読付)
タグ automatic development embedded formal framework model systems test testing toward
表題 (title) Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --
表題 (英文)
著者名 (author) Takahiro Ando,Shinji Kawasaki,Eun-Hye Choi,Hideaki Nishihara,Masahiro Aoki,Keiichi Yoshioka,Keisuke Shimatani,Munekazu Furuichi,Osamu Mizuno
英文著者名 (author) Takahiro Ando,Shinji Kawasaki,Eun-Hye Choi,Hideaki Nishihara,Masahiro Aoki,Keiichi Yoshioka,Keisuke Shimatani,Munekazu Furuichi,Osamu Mizuno
編者名 (editor)
編者名 (英文)
キー (key) Takahiro Ando,Shinji Kawasaki,Eun-Hye Choi,Hideaki Nishihara,Masahiro Aoki,Keiichi Yoshioka,Keisuke Shimatani,Munekazu Furuichi,Osamu Mizuno
書籍・会議録表題 (booktitle) Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings
書籍・会議録表題(英文)
巻数 (volume)
号数 (number) 4-4
ページ範囲 (pages)
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 11
出版年 (year) 2011
採択率 (acceptance)
URL
付加情報 (note) Hiroshima, Japan
注釈 (annote)
内容梗概 (abstract) This paper proposes a testing framework called Formal Model Based Test (FMBT). It is a framework to improve embedded system developments with formal specifications, exhaustive test generations, and automatic test executions.
論文電子ファイル published (application/pdf) [一般閲覧可]
BiBTeXエントリ
@inproceedings{id653,
         title = {Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --},
        author = {Takahiro Ando and Shinji Kawasaki and Eun-Hye Choi and Hideaki Nishihara and Masahiro Aoki and Keiichi Yoshioka and Keisuke Shimatani and Munekazu Furuichi and Osamu Mizuno},
     booktitle = {Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings},
        number = {4-4},
         month = {11},
          year = {2011},
          note = {Hiroshima, Japan},
}
  

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