SEL@KIT: M. Hirayama, T. Yamamoto, O. Mizuno, and T. Kikuno, Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---, November 2003.
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M. Hirayama, T. Yamamoto, O. Mizuno, and T. Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," In Proc. of 12th Asian Test Symposium (ATS03), pp. 210-215, November 2003.
ID 409
分類 国際会議(査読付)
タグ full-paper analysis comparison engineers generation high item low skilled software test
表題 (title) Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---
表題 (英文)
著者名 (author) Masayuki Hirayama,Tetsuya Yamamoto,Osamu Mizuno,Tohru Kikuno
英文著者名 (author) Masayuki Hirayama,Tetsuya Yamamoto,Osamu Mizuno,Tohru Kikuno
編者名 (editor)
編者名 (英文)
キー (key) Masayuki Hirayama,Tetsuya Yamamoto,Osamu Mizuno,Tohru Kikuno
書籍・会議録表題 (booktitle) Proc. of 12th Asian Test Symposium (ATS03)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 210-215
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 11
出版年 (year) 2003
採択率 (acceptance)
URL
付加情報 (note) Xian, China
注釈 (annote)
内容梗概 (abstract) Recent software system contains a lot of functions to provide
various services. According to this tendency, it is difficult to
ensure software quality and to eliminate crucial faults by
conventional software testing method. Especially, in the
conventional method, detail level of test items are widely deflected
according with the engineers skill, and this causes an immature
software quality. In this paper, we discuss the effects of test
engineers skill on test item generation, and propose a new test
item generation method, that enables the generation of test items
for illegal behavior of the system. The proposed method can generate
test items based on Use-case analysis, deviation analysis for legal
behavior, and faults tree analysis for system fault situations. From
the result of the experimental applications, we confirmed that test
items for illegal behavior of the system were effectively generated,
and also the proposed method could effectively assist test item
generation of poor skill engineer.

論文電子ファイル draft (application/pdf) [一般閲覧可]
BiBTeXエントリ
@inproceedings{id409,
         title = {Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---},
        author = {Masayuki Hirayama and Tetsuya Yamamoto and Osamu Mizuno and Tohru Kikuno},
     booktitle = {Proc. of 12th Asian Test Symposium (ATS03)},
         pages = {210-215},
         month = {11},
          year = {2003},
          note = {Xian, China},
}
  

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