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| M. Hirayama, T. Yamamoto, O. Mizuno, and T. Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," In Proc. of 12th Asian Test Symposium (ATS03), pp. 210-215, November 2003. | |
| ID | 409 |
| 分類 | 国際会議(査読付) |
| タグ | full-paper analysis comparison engineers generation high item low skilled software test |
| 表題 (title) |
Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers --- |
| 表題 (英文) |
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| 著者名 (author) |
Masayuki Hirayama,Tetsuya Yamamoto,Osamu Mizuno,Tohru Kikuno |
| 英文著者名 (author) |
Masayuki Hirayama,Tetsuya Yamamoto,Osamu Mizuno,Tohru Kikuno |
| 編者名 (editor) |
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| 編者名 (英文) |
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| キー (key) |
Masayuki Hirayama,Tetsuya Yamamoto,Osamu Mizuno,Tohru Kikuno |
| 書籍・会議録表題 (booktitle) |
Proc. of 12th Asian Test Symposium (ATS03) |
| 書籍・会議録表題(英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
210-215 |
| 組織名 (organization) |
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| 出版元 (publisher) |
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| 出版元 (英文) |
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| 出版社住所 (address) |
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| 刊行月 (month) |
11 |
| 出版年 (year) |
2003 |
| 採択率 (acceptance) |
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| URL |
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| 付加情報 (note) |
Xian, China |
| 注釈 (annote) |
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| 内容梗概 (abstract) |
Recent software system contains a lot of functions to provide
various services. According to this tendency, it is difficult to ensure software quality and to eliminate crucial faults by conventional software testing method. Especially, in the conventional method, detail level of test items are widely deflected according with the engineers skill, and this causes an immature software quality. In this paper, we discuss the effects of test engineers skill on test item generation, and propose a new test item generation method, that enables the generation of test items for illegal behavior of the system. The proposed method can generate test items based on Use-case analysis, deviation analysis for legal behavior, and faults tree analysis for system fault situations. From the result of the experimental applications, we confirmed that test items for illegal behavior of the system were effectively generated, and also the proposed method could effectively assist test item generation of poor skill engineer. |
| 論文電子ファイル | draft (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@inproceedings{id409,
title = {Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---},
author = {Masayuki Hirayama and Tetsuya Yamamoto and Osamu Mizuno and Tohru Kikuno},
booktitle = {Proc. of 12th Asian Test Symposium (ATS03)},
pages = {210-215},
month = {11},
year = {2003},
note = {Xian, China},
}
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