国際会議(査読付)

[1] Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu, Osamu Mizuno, and Tohru Kikuno, "Elimination of Crucial Faults by a New Selective Testing Method," In Proc. of 1st Internationl Symposium on Empirical Software Engineering (ISESE2002), pages 183-191, October 2002.

[2] Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu, Osamu Mizuno, and Tohru Kikuno, "Elimination of Crucial Faults for Embedded Software Using Functional Priority Testing," In Proc. of 6th International Conference on Probabilistic Safety Assessment and Management (PSAM6), pages 715-721, June 2002.