| Tweet | |
| M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "Elimination of Crucial Faults by a New Selective Testing Method," In Proc. of 1st Internationl Symposium on Empirical Software Engineering (ISESE2002), pp. 183-191, October 2002. | |
| ID | 137 |
| 分類 | 国際会議(査読付) |
| タグ | full-paper crucial elimination faults selective testing |
| 表題 (title) |
Elimination of Crucial Faults by a New Selective Testing Method |
| 表題 (英文) |
|
| 著者名 (author) |
Masayuki Hirayama,Tetsuya Yamamoto,Jiro Okayasu,Osamu Mizuno,Tohru Kikuno |
| 英文著者名 (author) |
Masayuki Hirayama,Tetsuya Yamamoto,Jiro Okayasu,Osamu Mizuno,Tohru Kikuno |
| 編者名 (editor) |
|
| 編者名 (英文) |
|
| キー (key) |
Masayuki Hirayama,Tetsuya Yamamoto,Jiro Okayasu,Osamu Mizuno,Tohru Kikuno |
| 書籍・会議録表題 (booktitle) |
Proc. of 1st Internationl Symposium on Empirical Software Engineering (ISESE2002) |
| 書籍・会議録表題(英文) |
|
| 巻数 (volume) |
|
| 号数 (number) |
|
| ページ範囲 (pages) |
183-191 |
| 組織名 (organization) |
|
| 出版元 (publisher) |
|
| 出版元 (英文) |
|
| 出版社住所 (address) |
|
| 刊行月 (month) |
10 |
| 出版年 (year) |
2002 |
| 採択率 (acceptance) |
60%, 20/33 |
| URL |
|
| 付加情報 (note) |
Nara, Japan. |
| 注釈 (annote) |
|
| 内容梗概 (abstract) |
Recent software systems contain a lot of functions to pro- vide various services. According to this tendency, software testing becomes more difficult than before and cost of test- ing increases so much, since many test items are required. In this paper, we propose and discuss such a new selective software testing method that is constructed from previous testing method by simplifying testing specification.
We have presented, in the previous work, a selective test- ing method to perform highly efficient software testing. The selective testing method has introduced an idea of functional priority testing and generated test items according to their functional priorities. Important functions with high priori- ties are tested in detail, and functions with low priorities are tested less intensively. As a result, additional cost for gener- ating testing instructions becomes relatively high. In this pa- per, in order to reduce its cost, we change the way of giving information with respect to priorities. The new method gives the priority only rather than generating testing instructions to each test item, which makes the testing method quite sim- ple and results in cost reduction. Except for this change, the new method is essentially the same as the previous method. We applied this new method to actual development of soft- ware tool and evaluated its effectiveness. From the result of the application experiment, we confirmed that many crucial faults can be detected by using the proposed method. |
| 論文電子ファイル | draft (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@inproceedings{id137,
title = {Elimination of crucial faults by a new selective testing method},
author = {Masayuki Hirayama and Tetsuya Yamamoto and Jiro Okayasu and Osamu Mizuno and Tohru Kikuno},
booktitle = {Proc. of 1st Internationl Symposium on Empirical Software Engineering (ISESE2002)},
pages = {183-191},
month = {10},
year = {2002},
acceptance = {60\%, 20/33},
note = {Nara, Japan.},
}
|