Effective and Efficient Software Testing

About this topic

We are investigating the code coverage of combinatorial testing and investigating prioritization of test cases using statistical analysis.

Publications

  • M. Jiang, T. Y. Chen, F. Kuo, Z. Ding, E. Choi, and O. Mizuno, "A Revisit of the Integration of Metamorphic Testing and Test Suite Based Automated Program Repair," In Proc. of 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET2017) (In conjunction with ICSE2017), pp. 14-20, May 2017. (Acceptance rate: 83.3%)
  • E. Choi, T. Fujiwara, and O. Mizuno, "Weighting for Combinatorial Testing by Bayesian Inference," In Proc. of 10th IEEE International Conference on Software Testing Verification and Validation Workshop (ICST2017), Posters track, pp. 189-191, March 2017.
  • T. Fujiwara, "Improvement of the Bayesian Inference Based Prioritized Combinatorial Testing and Assessment of the Tendency to Detect Faults," Master thesis, 京都工芸繊維大学 大学院工芸科学研究科, 2017.
  • E. Choi and O. Mizuno, "Towards Quality Improvement and Analysis of Combinatorial Testing," In IPSJ/SIGSE Winter Workshop 2017 in Hida-Takayama (WWS2017), pp. 13-14, January 2017.
  • E. Choi, O. Mizuno, and Y. Hu, "Code Coverage Analysis of Combinatorial Testing," In Proc. of 4th International Workshop on Quantitative Approaches to Software Quality (QuASoQ 2016), pp. 34-40, December 2016. (Hamilton, New Zealand)
  • K. Nishiura, E. Choi, O. Mizuno, "Fault Localization of Combinatorial Testing with Logistic Regression," FOSEソフトウェア工学の基礎研究会(FOSE2016), pp. 243-244, December 2016.
  • E. Choi, C. Artho, T. Kitamura, O. Mizuno, and A. Yamada, "Distance-Integrated Combinatorial Testing," In Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016), pp. 93-104, October 2016. (Ottawa, Canada) (Acceptance rate: 35%, 45/130)
  • E. Choi, S. Kawabata, O. Mizuno, C. Artho, and T. Kitamura, "Test Effectiveness Evaluation of Prioritized Combinatorial Testing: a Case Study," In Proc. of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS2016), pp. 61-68, August 2016. (Vienna, Austria) (Acceptance rate: 43%, 48/111)
  • S. Kawabata, E. Choi, O. Mizuno, "A Prioritization of Combinatorial Testing Using Bayesian Inference," 電子情報通信学会技術研究報告, 115(SS2015-95), pp. 115-120, March 2016. (宮古島市, 沖縄県)
  • O. Mizuno, "Auto-feeding and moving aquarium management droid — everybody’s Raspberry Pi contest, the grand prix work," Nikkei Linux, 17(4), pp. 77-83, April 2015.
  • E. Choi, H. Nishihara, T. Ando, N. V. Tang, M. Aoki, K. Yoshisaka, O. Mizuno, and H. Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, 2014(Article ID 909762), 21pages, May 2014. (JCR: 0.834 )
  • T. Ando, S. Kawasaki, E. Choi, H. Nishihara, M. Aoki, K. Yoshioka, K. Shimatani, M. Furuichi, and O. Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --," In Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, 4-4, November 2011. (Hiroshima, Japan)
  • T. Sumi, O. Mizuno, T. Kikuno, and M. Hirayama, "An Effective Testing Method for Hardware Related Fault in Embedded Software," IEICE Trans. on Information and Systems, E88-D(6), pp. 1142-1149, June 2005. (JCR: 0.242 (2005))
  • M. Hirayama, O. Mizuno, and T. Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," Journal of Computer Science and Technology, 20(2), pp. 250-257, March 2005. (JCR: 0.353 (2005))
  • M. Hirayama, O. Mizuno, and T. Kikuno, "Test Item Prioritizing Metrics for Selective Software Testing," IEICE Trans. on Information and Systems, E87-D(12), pp. 2733-2743, December 2004. (JCR: 0.274 (2004))
  • M. Hirayama, T. Yamamoto, O. Mizuno, and T. Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," In Proc. of 12th Asian Test Symposium (ATS03), pp. 210-215, November 2003. (Xian, China)
  • O. Mizuno, E. Shigematsu, Y. Takagi, and T. Kikuno, "On Estimating Testing Effort Needed to Assure Field Quality in Software Development," In Proc. of 13th International Symposium on Software Reliability Engineering (ISSRE2002), pp. 139-146, November 2002. (Annapolis, MD, USA.) (Acceptance rate: 45%, 33/73)
  • S. Amasaki, T. Yoshitomi, O. Mizuno, T. Kikuno, and Y. Takagi, "Statistical Analysis of Time Series Data on the Number of Faults Detected by Software Testing," In Proc. of 11th Asian Test Symposium (ATS02), pp. 272-277, November 2002. (Guam, USA.)
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "Elimination of Crucial Faults by a New Selective Testing Method," In Proc. of 1st Internationl Symposium on Empirical Software Engineering (ISESE2002), pp. 183-191, October 2002. (Nara, Japan.) (Acceptance rate: 60%, 20/33)
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "Elimination of Crucial Faults for Embedded Software Using Functional Priority Testing," In Proc. of 6th International Conference on Probabilistic Safety Assessment and Management (PSAM6), pp. 715-721, June 2002. (Puerto Lico, USA.)
  • E. Shigematsu, O. Mizuno, T. Kikuno, Y. Takagi, "Estimation of Software Testing Effort to Assure Permissible Number of Field Defects," 電子情報通信学会技術研究報告, 101(629, SS2001-35), pp. 9-15, January 2002.
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "A Selective Software Testing Method Based on Priorities Assigned to Functional Modules," In Proc. of 2nd Asia-Pacific Conference on Quality Software (APAQS2001), pp. 259-267, December 2001. (HongKong, China.) (Acceptance rate: 34%, 34/100)
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, T. Kikuno, "A New Selective Software Testing Method Based on Priorities Assigned to Functional Modules," 電子情報通信学会技術研究報告, 101(97-98, SS2001-6), pp. 1--8, May 2001.
  • M. Hirayama, J. Okayasu, T. Yamamoto, O. Mizuno, and T. Kikuno, "Generating Test Items for Checking Illegal Behaviors in Software Testing," In Proc. of 9th Asian Test Symposium (ATS2000), pp. 235-240, December 2000. (Taipei, Taiwan.)
  • M. Hirayama, T. Yamamoto, T. Kishimoto, O. Mizuno, and T. Kikuno, "Systematic Generation of Software Test Items Based on System Behavior from User's Viewpoint," In Proc. of International Conference on Probabilistic Safety Assessment and Management (PSAM5), pp. 2377-2382, November 2000. (Osaka, Japan.)
  • M. Hirayama, T. Kishimoto, O. Mizuno, T. Kikuno, "Generating Test Items by Applying Software Fault Tree Analysis," 電子情報通信学会技術研究報告, 99(547-548, SS99-53), pp. 25-32, January 2000.