ソフトウェアテストの効率化に関する研究

概要

組み合わせテスト手法は,少ないテストケースで効率的なテストを実施するための手法です.
本研究室では,組み合わせテストにおける優先度付けに対するデータマイニング的アプローチや組み合わせテストにおけるコードカバレッジの調査などを行っています.

研究成果

  • M. Jiang, T. Y. Chen, F. Kuo, Z. Ding, E. Choi, and O. Mizuno, "A Revisit of the Integration of Metamorphic Testing and Test Suite Based Automated Program Repair," In Proc. of 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET2017) (In conjunction with ICSE2017), pp. 14-20, May 2017. (Acceptance rate: 83.3%)
  • E. Choi, T. Fujiwara, and O. Mizuno, "Weighting for Combinatorial Testing by Bayesian Inference," In Proc. of 10th IEEE International Conference on Software Testing Verification and Validation Workshop (ICST2017), Posters track, pp. 189-191, March 2017.
  • 藤原, "ベイズ推定による優先度付き組み合わせテストの改良と不具合発見傾向の評価," 修士学位論文, 京都工芸繊維大学 大学院工芸科学研究科, 2017年.
  • E. Choi and O. Mizuno, "Towards Quality Improvement and Analysis of Combinatorial Testing," In ウィンターワークショップ2017・イン・飛騨高山, pp. 13-14, January 2017.
  • E. Choi, O. Mizuno, and Y. Hu, "Code Coverage Analysis of Combinatorial Testing," In Proc. of 4th International Workshop on Quantitative Approaches to Software Quality (QuASoQ 2016), pp. 34-40, December 2016. (Hamilton, New Zealand)
  • 西浦, 崔, 水野, "ロジスティック回帰分析を用いた組合せテストの不具合特定法の提案," FOSEソフトウェア工学の基礎研究会(FOSE2016), pp. 243-244, 2016年12月.
  • E. Choi, C. Artho, T. Kitamura, O. Mizuno, and A. Yamada, "Distance-Integrated Combinatorial Testing," In Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016), pp. 93-104, October 2016. (Ottawa, Canada) (Acceptance rate: 35%, 45/130)
  • E. Choi, S. Kawabata, O. Mizuno, C. Artho, and T. Kitamura, "Test Effectiveness Evaluation of Prioritized Combinatorial Testing: a Case Study," In Proc. of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS2016), pp. 61-68, August 2016. (Vienna, Austria) (Acceptance rate: 43%, 48/111)
  • 河端, 崔, 水野, "ベイズ推定を用いた組み合わせテスト最適化手法の提案," 電子情報通信学会技術研究報告, 115(SS2015-95), pp. 115-120, 2016年3月. (宮古島市, 沖縄県)
  • 水野, "「みんなのラズパイコンテスト」グランプリ作品: 移動して給餌する水槽管理ロボット〜目的の位置で撮影してツイート〜 (Raspberry Piで楽しいモノ作り) ," 日経Linux, 17(4), pp. 77-83, 2015年4月.
  • E. Choi, H. Nishihara, T. Ando, N. V. Tang, M. Aoki, K. Yoshisaka, O. Mizuno, and H. Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, 2014(Article ID 909762), 21pages, May 2014. (JCR: 0.834 )
  • T. Ando, S. Kawasaki, E. Choi, H. Nishihara, M. Aoki, K. Yoshioka, K. Shimatani, M. Furuichi, and O. Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --," In Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, 4-4, November 2011. (Hiroshima, Japan)
  • T. Sumi, O. Mizuno, T. Kikuno, and M. Hirayama, "An Effective Testing Method for Hardware Related Fault in Embedded Software," IEICE Trans. on Information and Systems, E88-D(6), pp. 1142-1149, June 2005. (JCR: 0.242 (2005))
  • M. Hirayama, O. Mizuno, and T. Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," Journal of Computer Science and Technology, 20(2), pp. 250-257, March 2005. (JCR: 0.353 (2005))
  • M. Hirayama, O. Mizuno, and T. Kikuno, "Test Item Prioritizing Metrics for Selective Software Testing," IEICE Trans. on Information and Systems, E87-D(12), pp. 2733-2743, December 2004. (JCR: 0.274 (2004))
  • M. Hirayama, T. Yamamoto, O. Mizuno, and T. Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," In Proc. of 12th Asian Test Symposium (ATS03), pp. 210-215, November 2003. (Xian, China)
  • O. Mizuno, E. Shigematsu, Y. Takagi, and T. Kikuno, "On Estimating Testing Effort Needed to Assure Field Quality in Software Development," In Proc. of 13th International Symposium on Software Reliability Engineering (ISSRE2002), pp. 139-146, November 2002. (Annapolis, MD, USA.) (Acceptance rate: 45%, 33/73)
  • S. Amasaki, T. Yoshitomi, O. Mizuno, T. Kikuno, and Y. Takagi, "Statistical Analysis of Time Series Data on the Number of Faults Detected by Software Testing," In Proc. of 11th Asian Test Symposium (ATS02), pp. 272-277, November 2002. (Guam, USA.)
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "Elimination of Crucial Faults by a New Selective Testing Method," In Proc. of 1st Internationl Symposium on Empirical Software Engineering (ISESE2002), pp. 183-191, October 2002. (Nara, Japan.) (Acceptance rate: 60%, 20/33)
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "Elimination of Crucial Faults for Embedded Software Using Functional Priority Testing," In Proc. of 6th International Conference on Probabilistic Safety Assessment and Management (PSAM6), pp. 715-721, June 2002. (Puerto Lico, USA.)
  • 重松, 水野, 菊野, 高木, "フィールド不具合数を許容値以下に抑えるためのソフトウェアテスト工数の推定モデルの提案," 電子情報通信学会技術研究報告, 101(629, SS2001-35), pp. 9-15, 2002年1月.
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "A Selective Software Testing Method Based on Priorities Assigned to Functional Modules," In Proc. of 2nd Asia-Pacific Conference on Quality Software (APAQS2001), pp. 259-267, December 2001. (HongKong, China.) (Acceptance rate: 34%, 34/100)
  • 平山, 山本, 岡安, 水野, 菊野, "機能モジュールに対する優先度に基づいた選択的ソフトウェアテスト手法の提案," 電子情報通信学会技術研究報告, 101(97-98, SS2001-6), pp. 1--8, 2001年5月.
  • M. Hirayama, J. Okayasu, T. Yamamoto, O. Mizuno, and T. Kikuno, "Generating Test Items for Checking Illegal Behaviors in Software Testing," In Proc. of 9th Asian Test Symposium (ATS2000), pp. 235-240, December 2000. (Taipei, Taiwan.)
  • M. Hirayama, T. Yamamoto, T. Kishimoto, O. Mizuno, and T. Kikuno, "Systematic Generation of Software Test Items Based on System Behavior from User's Viewpoint," In Proc. of International Conference on Probabilistic Safety Assessment and Management (PSAM5), pp. 2377-2382, November 2000. (Osaka, Japan.)
  • 平山, 岸本, 水野, 菊野, "UseCaseを利用したソフトウェアフォールトに対するSS-FTAの提案," 電子情報通信学会技術研究報告, 99(547-548, SS99-53), pp. 25-32, 2000年1月.