SEL@KIT
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国際会議(査読付)
[1] Mingyue Jiang, Tsong Yueh Chen, Fei-Ching Kuo, Zuohua Ding, Eun-Hye Choi, and Osamu Mizuno, "A Revisit of the Integration of Metamorphic Testing and Test Suite Based Automated Program Repair," In Proc. of 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET2017) (In conjunction with ICSE2017), pages 14-20, May 2017.

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