SEL@KIT: E. Choi, C. Artho, T. Kitamura, O. Mizuno, and A. Yamada, Distance-Integrated Combinatorial Testing, October 2016.
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E. Choi, C. Artho, T. Kitamura, O. Mizuno, and A. Yamada, "Distance-Integrated Combinatorial Testing," In Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016), pp. 93-104, October 2016.
ID 728
分類 国際会議(査読付)
タグ combinatorial distance-integrated testing full-paper major-mizuno
表題 (title) Distance-Integrated Combinatorial Testing
表題 (英文)
著者名 (author) Eun-Hye Choi,Cyrille Artho,Takashi Kitamura,Osamu Mizuno,Akihisa Yamada
英文著者名 (author) Eun-Hye Choi,Cyrille Artho,Takashi Kitamura,Osamu Mizuno,Akihisa Yamada
編者名 (editor)
編者名 (英文)
キー (key) Eun-Hye Choi,Cyrille Artho,Takashi Kitamura,Osamu Mizuno,Akihisa Yamada
書籍・会議録表題 (booktitle) Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016)
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 93-104
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 10
出版年 (year) 2016
採択率 (acceptance) 35%, 45/130
URL 10.1109/ISSRE.2016.26
付加情報 (note) Ottawa, Canada
注釈 (annote)
内容梗概 (abstract) This paper proposes a novel approach to
combinatorial test generation, which achieves an increase of not
only the number of new combinations but also the {\em distance}
between test cases. We applied our distance-integrated approach to
a state-of-the-art greedy algorithm for traditional combinatorial
test generation by using two distance metrics, Hamming distance, and
a modified chi-square distance. Experimental results using numerous
benchmark models show that combinatorial test suites generated by
our approach using both distance metrics can
improve interaction coverage for higher
interaction strengths with low computational overhead.

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BiBTeXエントリ
@inproceedings{id728,
         title = {Distance-integrated Combinatorial Testing},
        author = {Eun-Hye Choi and Cyrille Artho and Takashi Kitamura and Osamu Mizuno and Akihisa Yamada},
     booktitle = {Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016)},
         pages = {93-104},
         month = {10},
          year = {2016},
    acceptance = {35\%, 45/130},
          note = {Ottawa, Canada},
}
  

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