共同研究者: 崔 銀惠

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所属

  • 国立研究開発法人 産業技術総合研究所(AIST) 主任研究員
  • Web page

研究テーマ

  • ソフトウェアシステムのテスト・検証
    • 組み合わせテスト設計・モデリング・分析
    • 不具合組み合わせ特定

共同研究業績

  • Kinari Nishiura, Eun-Hye Choi, Eunjong Choi, and Osamu Mizuno, "Two Improving Approaches for Faulty Interaction Localization Using Logistic Regression Analysis," Software Quality Journal, May 2024. (JCR: 1.9 (2022))
  • Masanari Kondo, Daniel M. German, Osamu Mizuno, and Eun-Hye Choi, "The Impact of Context Metrics on Just-In-Time Defect Prediction," Empirical Software Engineering, 25(1), 890–939, 2020. (JCR: 4.457 (2019))
  • Masanari Kondo, Daniel German, Osamu Mizuno, and Eun-Hye Choi, "The Impact of Context Metrics on Just-In-Time Defect Prediction," In Journal First/Conference Second track, International Conference on Software Maintenance and Evolution (ICSME 2019), September 2019.
  • Masanari Kondo, Daniel German, Osamu Mizuno, and Eun-Hye Choi, "SIGSE卓越論文賞: The Impact of Context Lines on Just-In-Time Defect Prediction,," Empirical Software Engineering, August 2019.
  • 西浦 生成, 崔 銀惠, 水野 修, "ロジスティック回帰分析を利用した組み合わせテスト結果からの不具合誘発パラメータ組み合わせ特定法の改善," ソフトウェア信頼性研究会ワークショップ(FORCE2018), 2018年12月. (千葉工業大学)
  • 西浦 生成, 崔 銀惠, 水野 修, "機械学習による不具合組み合わせ特定への自動分類法の提案と評価," 情報処理学会論文誌, 59(4), pp. 1215-1224, 2018年4月.
  • 近藤 将成, 森 啓太, 水野 修, 崔 銀惠, "深層学習によるソースコードコミットからの不具合混入予測," 情報処理学会論文誌, 59(4), pp. 1250-1261, 2018年4月.
  • 近藤 将成, 森 啓太, 水野 修, 崔 銀惠, "特選論文: 深層学習によるソースコードコミットからの不具合混入予測," 情報処理学会論文誌, 59(4), pp. 1250-1261, 2018年4月.
  • 近藤 将成, 森 啓太, 水野 修, 崔 銀惠, "善吾賞: 深層学習による不具合混入コミットの予測と評価（SES2017発表論文）," NPO法人 ASTER, 2018年3月.
  • Masanari Kondo, Osamu Mizuno, and Eun-Hye Choi, "Causal-Effect Analysis Using Bayesian Lingam Comparing with Correlation Analysis in Function Point Metrics and Effort," International Journal of Mathematical, Engineering and Management Sciences (IJMEMS), 3(2), 90–112, 2018.
  • 西浦 生成, 崔 銀惠, 水野 修, "機械学習による不具合組み合わせ特定への自動分類法の提案と評価," ソフトウェアエンジニアリングシンポジウム2017論文集 (SES2017) , pp. 25-34, 2017年8月. (東京都)
  • 近藤 将成, 森 啓太, 水野 修, 崔 銀惠, "深層学習による不具合混入コミットの予測と評価," ソフトウェアエンジニアリングシンポジウム2017論文集 (SES2017) , pp. 35-44, 2017年8月. (東京都)
  • 西浦 生成, 崔 銀惠, 水野 修, "学生奨励賞: 機械学習による不具合組み合わせ特定への自動分類法の提案と評価," ソフトウェアエンジニアリングシンポジウム2017 (SES2017), 2017年8月.
  • 近藤 将成, 森 啓太, 水野 修, 崔 銀惠, "最優秀論文賞: 深層学習による不具合混入コミットの予測と評価," ソフトウェアエンジニアリングシンポジウム2017 (SES2017), 2017年8月.
  • Kinari Nishiura, Eun-Hye Choi, and Osamu Mizuno, "Improving Faulty Interaction Localization Using Logistic Regression," In Proc. of the 2017 IEEE International Conference on Software Quality, Reliability & Security (QRS2017), pp. 138-149, July 2017. (Plague, Czech) (Acceptance rate: 25.77%)
  • Mingyue Jiang, Tsong Yueh Chen, Fei-Ching Kuo, Zuohua Ding, Eun-Hye Choi, and Osamu Mizuno, "A Revisit of the Integration of Metamorphic Testing and Test Suite Based Automated Program Repair," In Proc. of 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET2017) (In conjunction with ICSE2017), pp. 14-20, May 2017. (Buenos Aires, Argentina) (Acceptance rate: 83.3%)
  • Yoshiyuki Harada, Yoriyuki Yamagata, Osamu Mizuno, and Eun-Hye Choi, "Log-Based Anomaly Detection of CPS Using a Statistical Method," In Proc. of the 8th IEEE International Workshop on Empirical Software Engineering in Practice (IWESEP2017), pp. 1-6, March 2017. (Tokyo, Japan) (Acceptance rate: 62.5%, 10/16)
  • Eun-Hye Choi, Tsuyoshi Fujiwara, and Osamu Mizuno, "Weighting for Combinatorial Testing by Bayesian Inference," In Proc. of 10th IEEE International Conference on Software Testing Verification and Validation Workshop (ICST2017), Posters track, pp. 189-191, March 2017. (Tokyo, Japan)
  • Yoshiyuki Harada, Yoriyuki Yamagata, Osamu Mizuno, and Eun-Hye Choi, "Best Paper Award: a Log-Based Anomaly Detection of Cps Using a Statistical Method," In the 8th IEEE International Workshop on Empirical Software Engineering in Practice (IWESEP2017), March 2017.
  • Eun-Hye Choi and Osamu Mizuno, "Towards Quality Improvement and Analysis of Combinatorial Testing," In ウィンターワークショップ2017・イン・飛騨高山, pp. 13-14, January 2017.
  • 西浦 生成, 崔 銀惠, 水野 修, "ロジスティック回帰分析を用いた組合せテストの不具合特定法の提案," FOSEソフトウェア工学の基礎研究会(FOSE2016), pp. 243-244, 2016年12月.
  • 西浦 生成, 崔 銀惠, 水野 修, "機械学習を用いた不具合組合せ特定法の提案," ソフトウェア信頼性研究会ワークショップ (FORCE2016), 2016年12月.
  • Eun-Hye Choi, Osamu Mizuno, and Yifan Hu, "Code Coverage Analysis of Combinatorial Testing," In Proc. of 4th International Workshop on Quantitative Approaches to Software Quality (QuASoQ 2016), pp. 34-40, December 2016. (Hamilton, New Zealand)
  • Eun-Hye Choi, Cyrille Artho, Takashi Kitamura, Osamu Mizuno, and Akihisa Yamada, "Distance-Integrated Combinatorial Testing," In Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016), pp. 93-104, October 2016. (Ottawa, Canada) (Acceptance rate: 35%, 45/130)
  • Eun-Hye Choi, Shunya Kawabata, Osamu Mizuno, Cyrille Artho, and Takashi Kitamura, "Test Effectiveness Evaluation of Prioritized Combinatorial Testing: a Case Study," In Proc. of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS2016), pp. 61-68, August 2016. (Vienna, Austria) (Acceptance rate: 43%, 48/111)
  • Yukiya Uneno, Osamu Mizuno, and Eun-Hye Choi, "Using a Distributed Representation of Words in Localizing Relevant Files for Bug Reports," In Proc. of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS2016), pp. 183-190, August 2016. (Vienna, Austria) (Acceptance rate: 43%, 48/111)
  • 河端 駿也, 崔 銀惠, 水野 修, "ベイズ推定を用いた組み合わせテスト最適化手法の提案," 電子情報通信学会技術研究報告, 115(SS2015-95), pp. 115-120, 2016年3月. (宮古島市, 沖縄県)
  • 釆野 友紀也, 水野 修, 崔 銀惠, "Word2Vecを用いたバグ報告からの不具合ファイル特定," 電子情報通信学会技術研究報告, 115(SS2015-85), pp. 55-60, 2016年3月. (宮古島市, 沖縄県)
  • Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and Hitoshi Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, 2014(Article ID 909762), 21pages, May 2014. (JCR: 0.834 )
  • Takahiro Ando, Shinji Kawasaki, Eun-Hye Choi, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshioka, Keisuke Shimatani, Munekazu Furuichi, and Osamu Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --," In Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, 4-4, November 2011. (Hiroshima, Japan)
  • Eun-Hye Choi, Takahiro Ando, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshisaka, Takao Sonoda, Shouichi Hasuike, and Osamu Mizuno, "Sens - Specification Language for Embedded Network Systems - Toward Automatic Test Generation (Preliminary Version)," PS-2011-002, Collaborative Research Team for Verification and Specification, National Institute of Advanced Industrial Science and Technology, August 2011.