2014

Academic Journal

[1] Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and and Hitoshi Osaki, "Formal Specification based Automatic Test Generation for Embedded Network Systems", Journal of Applied Mathematics, 2014(Article ID 909762),  21pages, May 2014.