2014

Academic Journal

[1] Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and and Hitoshi Osaki, "Formal Specification based Automatic Test Generation for Embedded Network Systems", Journal of Applied Mathematics, 2014(Article ID 909762),  21pages, May 2014.

2011

International Conference

[1] Takahiro Ando, Shinji Kawasaki, Eun-Hye Choi, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshioka, Keisuke Shimatani, Munekazu Furuichi, and and Osamu Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --", Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, November 2011.

Technical report

[1] Eun-Hye Choi, Takahiro Ando, Hideaki Nishihara, Masahiro Aoki, Keiichi Yoshisaka, Takao Sonoda, Shouichi Hasuike, and and Osamu Mizuno, "SENS - Specification Language for Embedded Network Systems - toward Automatic Test Generation (Preliminary Version)",    Collaborative Research Team for Verification and Specification, National Institute of Advanced Industrial Science and Technology, 2011.

2010

Workshop

[1] Eun-Hye Choi, Hiroyuki Ozaki, Hayao Nakahara, Yoshiki Kinoshita, Masahiro Aoki, Keiichi Yoshisaka, Hiroshi Mine, and and Toru Shimizu, "組込みネットワークシステムの形式モデル指向テストに向けて", ソフトウェア信頼性研究会第6回ワークショップ(FORCE2010)論文集, pp. 4--17, 2010.