SEL@KIT: M. Idehara and O. Mizuno, An Empirical Analysis between Age of Code Modules and Software Defects, November 2011.
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M. Idehara and O. Mizuno, "An Empirical Analysis between Age of Code Modules and Software Defects," In Proc. of the Joint Conference of the 21th International Workshop on Software Measurement and the 6th International Conference on Software Process and Product Measurement (IWSM/MENSURA2011), Fast abstracts, pp. 11-14, November 2011.
ID 651
分類 国際会議(査読付)
タグ age analysis code defects empirical modules software
表題 (title) An Empirical Analysis between Age of Code Modules and Software Defects
表題 (英文)
著者名 (author) Mahito Idehara,Osamu Mizuno
英文著者名 (author) Mahito Idehara,Osamu Mizuno
編者名 (editor)
編者名 (英文)
キー (key) Mahito Idehara,Osamu Mizuno
書籍・会議録表題 (booktitle) Proc. of the Joint Conference of the 21th International Workshop on Software Measurement and the 6th International Conference on Software Process and Product Measurement (IWSM/MENSURA2011), Fast abstracts
書籍・会議録表題(英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 11-14
組織名 (organization)
出版元 (publisher)
出版元 (英文)
出版社住所 (address)
刊行月 (month) 11
出版年 (year) 2011
採択率 (acceptance)
URL
付加情報 (note) Nara, Japan
注釈 (annote)
内容梗概 (abstract) Keeping software modules with no fault is almost impossible in a
real software development. For that reason, it is important in
software development to find and fix faults as early as possible.
To do so, many studies have been done to analyze the relationship
between the faults and software metrics.
In this study, our hypothesis is that the age of software modules affects on
the quality of software. To confirm this, we propose metrics that
can be easily measured from the revision history. We also conducted
an experiment to collect these metrics from several open source
software projects, and analyze relevance to fault existence. We can
successfully model the relevance between the age of modules and the
rate of fault existence.

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BiBTeXエントリ
@inproceedings{id651,
         title = {An Empirical Analysis between Age of Code Modules and Software Defects},
        author = {Mahito Idehara and Osamu Mizuno},
     booktitle = {Proc. of the Joint Conference of the 21th International Workshop on Software Measurement and the 6th International Conference on Software Process and Product Measurement (IWSM/MENSURA2011), Fast abstracts},
         pages = {11-14},
         month = {11},
          year = {2011},
          note = {Nara, Japan},
}
  

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