Effective and Efficient Software Testing

Posted by On Filed under

About this topic

We are investigating the code coverage of combinatorial testing and investigating prioritization of test cases using statistical analysis.

Publications

  • K. Nishiura, O. Mizuno, E. Choi, "An Investigation of Transplantable Test Methods Toward Automatic Java Test Codes Generation by Reusing Existing Test Codes," Trans. of Information Processing Society of Japan, 62(4), pp. 1019-1028, April 2021.
  • M. Jiang, T. Y. Chen, F. Kuo, Z. Ding, E. Choi, and O. Mizuno, "A Revisit of the Integration of Metamorphic Testing and Test Suite Based Automated Program Repair," In Proc. of 2017 IEEE/ACM 2nd International Workshop on Metamorphic Testing (MET2017) (In conjunction with ICSE2017), pp. 14-20, May 2017. (Acceptance rate: 83.3%)
  • E. Choi, T. Fujiwara, and O. Mizuno, "Weighting for Combinatorial Testing by Bayesian Inference," In Proc. of 10th IEEE International Conference on Software Testing Verification and Validation Workshop (ICST2017), Posters track, pp. 189-191, March 2017.
  • T. Fujiwara, "Improvement of the Bayesian Inference Based Prioritized Combinatorial Testing and Assessment of the Tendency to Detect Faults," Master thesis, 京都工芸繊維大学 大学院工芸科学研究科, 2017.
  • E. Choi and O. Mizuno, "Towards Quality Improvement and Analysis of Combinatorial Testing," In IPSJ/SIGSE Winter Workshop 2017 in Hida-Takayama (WWS2017), pp. 13-14, January 2017.
  • E. Choi, O. Mizuno, and Y. Hu, "Code Coverage Analysis of Combinatorial Testing," In Proc. of 4th International Workshop on Quantitative Approaches to Software Quality (QuASoQ 2016), pp. 34-40, December 2016. (Hamilton, New Zealand)
  • K. Nishiura, E. Choi, O. Mizuno, "Fault Localization of Combinatorial Testing with Logistic Regression," FOSEソフトウェア工学の基礎研究会(FOSE2016), pp. 243-244, December 2016.
  • E. Choi, C. Artho, T. Kitamura, O. Mizuno, and A. Yamada, "Distance-Integrated Combinatorial Testing," In Proc. of 27th International Symposium on Software Reliability Engineering (ISSRE2016), pp. 93-104, October 2016. (Ottawa, Canada) (Acceptance rate: 35%, 45/130)
  • E. Choi, S. Kawabata, O. Mizuno, C. Artho, and T. Kitamura, "Test Effectiveness Evaluation of Prioritized Combinatorial Testing: a Case Study," In Proc. of the 2016 IEEE International Conference on Software Quality, Reliability & Security (QRS2016), pp. 61-68, August 2016. (Vienna, Austria) (Acceptance rate: 43%, 48/111)
  • S. Kawabata, E. Choi, O. Mizuno, "A Prioritization of Combinatorial Testing Using Bayesian Inference," 電子情報通信学会技術研究報告, 115(SS2015-95), pp. 115-120, March 2016. (宮古島市, 沖縄県)
  • O. Mizuno, "Auto-feeding and moving aquarium management droid — everybody’s Raspberry Pi contest, the grand prix work," Nikkei Linux, 17(4), pp. 77-83, April 2015.
  • E. Choi, H. Nishihara, T. Ando, N. V. Tang, M. Aoki, K. Yoshisaka, O. Mizuno, and H. Osaki, "Formal Specification Based Automatic Test Generation for Embedded Network Systems," Journal of Applied Mathematics, 2014(Article ID 909762), 21pages, May 2014. (JCR: 0.834 )
  • T. Ando, S. Kawasaki, E. Choi, H. Nishihara, M. Aoki, K. Yoshioka, K. Shimatani, M. Furuichi, and O. Mizuno, "Development of Formal Model Based Test -- Toward Automatic Testing Framework for Embedded Systems --," In Proc. of 22nd International Symposium on Software Reliability Engineering (ISSRE2011), Supplemental proceedings, 4-4, November 2011. (Hiroshima, Japan)
  • T. Sumi, O. Mizuno, T. Kikuno, and M. Hirayama, "An Effective Testing Method for Hardware Related Fault in Embedded Software," IEICE Trans. on Information and Systems, E88-D(6), pp. 1142-1149, June 2005. (JCR: 0.242 (2005))
  • M. Hirayama, O. Mizuno, and T. Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," Journal of Computer Science and Technology, 20(2), pp. 250-257, March 2005. (JCR: 0.353 (2005))
  • M. Hirayama, O. Mizuno, and T. Kikuno, "Test Item Prioritizing Metrics for Selective Software Testing," IEICE Trans. on Information and Systems, E87-D(12), pp. 2733-2743, December 2004. (JCR: 0.274 (2004))
  • M. Hirayama, T. Yamamoto, O. Mizuno, and T. Kikuno, "Analysis of Software Test Item Generation --- Comparison between High Skilled and Low Skilled Engineers ---," In Proc. of 12th Asian Test Symposium (ATS03), pp. 210-215, November 2003. (Xian, China)
  • O. Mizuno, E. Shigematsu, Y. Takagi, and T. Kikuno, "On Estimating Testing Effort Needed to Assure Field Quality in Software Development," In Proc. of 13th International Symposium on Software Reliability Engineering (ISSRE2002), pp. 139-146, November 2002. (Annapolis, MD, USA.) (Acceptance rate: 45%, 33/73)
  • S. Amasaki, T. Yoshitomi, O. Mizuno, T. Kikuno, and Y. Takagi, "Statistical Analysis of Time Series Data on the Number of Faults Detected by Software Testing," In Proc. of 11th Asian Test Symposium (ATS02), pp. 272-277, November 2002. (Guam, USA.)
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "Elimination of Crucial Faults by a New Selective Testing Method," In Proc. of 1st Internationl Symposium on Empirical Software Engineering (ISESE2002), pp. 183-191, October 2002. (Nara, Japan.) (Acceptance rate: 60%, 20/33)
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "Elimination of Crucial Faults for Embedded Software Using Functional Priority Testing," In Proc. of 6th International Conference on Probabilistic Safety Assessment and Management (PSAM6), pp. 715-721, June 2002. (Puerto Lico, USA.)
  • E. Shigematsu, O. Mizuno, T. Kikuno, Y. Takagi, "Estimation of Software Testing Effort to Assure Permissible Number of Field Defects," 電子情報通信学会技術研究報告, 101(629, SS2001-35), pp. 9-15, January 2002.
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, and T. Kikuno, "A Selective Software Testing Method Based on Priorities Assigned to Functional Modules," In Proc. of 2nd Asia-Pacific Conference on Quality Software (APAQS2001), pp. 259-267, December 2001. (HongKong, China.) (Acceptance rate: 34%, 34/100)
  • M. Hirayama, T. Yamamoto, J. Okayasu, O. Mizuno, T. Kikuno, "A New Selective Software Testing Method Based on Priorities Assigned to Functional Modules," 電子情報通信学会技術研究報告, 101(97-98, SS2001-6), pp. 1--8, May 2001.
  • M. Hirayama, J. Okayasu, T. Yamamoto, O. Mizuno, and T. Kikuno, "Generating Test Items for Checking Illegal Behaviors in Software Testing," In Proc. of 9th Asian Test Symposium (ATS2000), pp. 235-240, December 2000. (Taipei, Taiwan.)
  • M. Hirayama, T. Yamamoto, T. Kishimoto, O. Mizuno, and T. Kikuno, "Systematic Generation of Software Test Items Based on System Behavior from User's Viewpoint," In Proc. of International Conference on Probabilistic Safety Assessment and Management (PSAM5), pp. 2377-2382, November 2000. (Osaka, Japan.)
  • M. Hirayama, T. Kishimoto, O. Mizuno, T. Kikuno, "Generating Test Items by Applying Software Fault Tree Analysis," 電子情報通信学会技術研究報告, 99(547-548, SS99-53), pp. 25-32, January 2000.